Hanisch J., Falter M., Backer M., Rikel M., Driessche I., Meledin A., Rijckaert H., Bennewitz J., Diez-Sierra J., Sadewasser M., Koliotassis L., Lopez-Dominguez P.
Ключевые слова: HTS, YBCO, coated conductors, chemical solution deposition, reel-to-reel process, nanocomposites, substrate Ni-W, fabrication, doping effect, nanoscaled effects, nanoparticles, critical current, distribution, uniformity, angular dependence, critical caracteristics, Jc/B curves, pinning force, temperature dependence, magnetic field dependence, X-ray diffraction, microstructure, commercialization
Ключевые слова: HTS, coated conductors, transport currents, grain structure, grain boundaries, PLD process, microstructure, magnetic field distribution, substrate Ni-W, substrate stainless steel, critical caracteristics, Jc/B curves, peak effect, angular dependence, vortex structures, experimental results
Ключевые слова: HTS, coated conductors, grain boundaries, PLD process, substrate Ni-W, YBCO, RABITS process, magnetic field distribution, critical caracteristics, angular dependence, transport currents, magnetic field dependence, IBAD process, chemical solution deposition, comparison, microstructure
Tendeloo G.V., Eibl O., Falter M., Backer M., Hollmann E., Wordenweber R., Molina-Luna L., Bretos I., Schneller T.
Glowacki B.A., Granados X., Puig T., Obradors X., Usoskin A., Hopkins S.C., Ricart S., Falter M., Backer M., Vlad V.R., Vilardell M., Calleja A., Joseph D., Mitchell-Williams T.B.
Ключевые слова: HTS, YBCO, coated conductors, tapes multifilamentary, inkjet printing, fabrication, ac losses
Glowacki B.A., Hopkins S.C., Falter M., Backer M., Patel A., Van Driessche I., M.Mosiadz, Juda K.L., Vandaele K., Soloducho J.
Ключевые слова: patents, HTS, coated conductors, substrate metallic, buffer layers, texture, YBCO, chemical solution deposition, fabrication
Ключевые слова: HTS, coated conductors, buffer layers, chemical solution deposition, microstructure, fabrication
Holzapfel B., Schultz L., Apetrii C.(c.apetrii@ifw-dresden.de), Schlorb H., Falter M., Lampe I.(lamp0634@mailbox.tu-berlin.de)
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